Micron S.M.A.R.T. attributes

ID Hex Name Description
01 01 Raw Read Error Rate The data field holds the raw sum of correctable and uncorrectable ECC (error-correcting code) error events over the life of the drive. If this ever exceeds 4.294.967.295, this value will wrap around.
05 05 Re-Allocated Block Count This value gives the total bad block count of the drive minus the number of one-time programmable (OTP) bad blocks.
05 05 Reallocated Sector Count The total number of reallocated sectors.
05 05 Reallocated NAND Block Count The total number of reallocated blocks.
09 09 Power-On Hours Count This value gives the raw number of hours that the device has been online over its life.
12 0C Power Cycle Count This value gives the raw number of power cycle events that this drive has experienced.
170 AA New Failing Block Count This value gives the total bad block count of the drive minus the number of one-time programmable (OTP) bad blocks.
170 AA Reserved Block Count This value gives the total bad block count of the drive minus the number of one-time programmable (OTP) bad blocks.
171 AB Program Fail Count This value contains the raw number of flash program failure events. If this value ever would exceed 65,535, it will stay at 65,535.
172 AC Erase Fail Count This value contains the raw number of flash erase failure events. If this value ever would exceed 65,535, it will stay at 65,535.
173 AD Block Wear Leveling Count Average erase count of all good blocks.
173 AD Average Block-Erase Count This value is the average erase count of all super blocks. One super block is defined to include all the physical blocks with the same block number of all planes.
174 AE Unexpected Power Loss Count The total number of times that the device has been power cycled unexpectedly.
181 B5 Non-4K Aligned Access Count This attribute contains two values: the low order 16 bits of the raw data contain the total unaligned reads counter, divided by 60,000, with a ceiling value of 65,535; the high order 16 bits of the raw data contain the total unaligned writes counter, divided by 60,000, with a ceiling value of 65,535.
180 B4 Unused Reserve (Spare) NAND Blocks The raw value of this attribute gives the count of unused reserved blocks.
181 B5 Unaligned Access Count This attribute provides data that is tracked by Micron engineering. It is not indicative of SSD wear or of impending failure.
183 B7 SATA Interface Downshift At completion of speed negotiation between host and device, the firmware records the value of the newly negotiated speed. This value is compared to the previously recorded value; if the new value is lower than the previous, a downshift has occurred and the downshift counter is incremented.
184 B8 Error Correction Count This value is the count of end-to-end correction events.
187 BB Reported Uncorrectable Errors This value is the total number of ECC (error-correcting code) correction failures reported by the sequencer.
188 BC Command Timeouts This counter is incremented by the number of outstanding commands when the host issues a soft reset, host reset, or a comreset. The raw data holds the value of this counter. If it ever exceeds 4.294.967.295, it will wrap around.
188 BC Command Timeout Count This value is the total number of command timeouts. This attribute tracks the number of command timeouts as defined by an active command being interrupted by a reset or another command.
189 BD Factory Bad Block Count One-time programmable (OTP) bad block count.
194 C2 Enclosure Temperature This value report the current device temperature.
195 C3 Cumulative Corrected ECC This attribute provides data that is tracked by Micron engineering. It is not indicative of SSD wear or of impending failure.
196 C4 Reallocation Event Count This value gives the total bad block count of the drive minus the number of one-time programmable (OTP) bad blocks.
197 C5 Current Pending Sector Count This value gives the number of blocks waiting to be remapped.
198 C6 SMART Off-Line Scan Uncorrectable Error Count Uncorrectable errors detected during SMART off-line scan.
198 C6 SMART Off-line Scan Uncorrectable Sector Count This value is the cumulative number of unrecoverable read errors found in a background media scan. If no background media scan has been run, a value of 0 will be returned.
199 C7 Ultra DMA CRC Error Rate Gives the number of captured FIS (frame information structure) interface general CRC (cyclic redundancy check) errors over the life of the drive, for both reads and writes, since the most recent power cycle. If this counter ever reaches 4.294.967.295, it will wrap around.
199 C7 Ultra-DMA CRC Error Count This value is the cumulative number of FIS (frame information structure) interface general CRC (cycle redundancy check) error counts over the life of the drive, for both reads and writes, since the most recent power cycle.
202 CA Percentage Lifetime Used The average erase count of all blocks on Channel 0 CE 0 divided by the specified !MaxEraseCount (10k for MLC or 100k for SLC), reported as a percentage from 0 to 100%.
202 CA Percent Lifetime Remaining The normalized value reports the remaining life on device, reported as a percentage from 100 to 0%.
206 CE Write Error Rate Report the number of program failures divided by 60,000. If the value ever reaches 65,535, it will remain there thereafter.
210 D2 Successful RAIN Recovery Count The total number of TUs successfully recovered by RAIN (redundant array of independent NAND).
246 F6 Total Host Sector Writes The total number of sectors written by the host.
247 F7 Contact Factory Contact factory for details.
248 F8 Contact Factory Contact factory for details.

Sources

Micron TN-FD-05: P400e SSD SMART Implementation for FW0135, FW0152
Micron M500 SSD SMART Attributes - Firmware MU02 and MU03 or Later

Last edited Feb 14, 2014 at 4:16 PM by Eruestan, version 1